Automated Test-Trace Inspection for Microcontroller Binary Code

Posted on February 19, 2016 by
by Thomas Reinbacher, Jörg Brauer, Daniel Schachinger, Andreas Steininger, Stefan Kowalewski
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Reference:
Automated Test-Trace Inspection for Microcontroller Binary Code (Thomas Reinbacher, Jörg Brauer, Daniel Schachinger, Andreas Steininger, Stefan Kowalewski), In RV, Springer, 2011.
Bibtex Entry:
@inproceedings { RBS+11,
	author = { Reinbacher, Thomas and Brauer, J{"o}rg and Schachinger,
		Daniel and Steininger, Andreas and Kowalewski, Stefan },
	title = { Automated Test-Trace Inspection for Microcontroller Binary
		Code },
	booktitle = { RV },
	publisher = { Springer },
	publishedas = { Druck },
	isbn = { 978-3-642-29859-2 },
	language = { eng },
	pages = { 239--244 },
	year = { 2011 },
	timestamp = { 2011.12.14 },
	i11key = { conference },
	url = { http://www.embedded.rwth-aachen.de/lib/exe/fetch.php?media=bib:rbs11.pdf },
	for_reporting_period = { 2011 },
}

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